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Performance and applications of gallium-nitride monolithic microwave integrated circuits (GaN MMICs)

机译:氮化镓单片微波集成电路(GaN MMIC)的性能和应用

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摘要

The evolution of wide-bandgap semiconductor transistor technology is placed in historical context with other active device technologies. The relative rapidity of GaN transistor development is noted and is attributed to the great parallel activity in the lighting sector and the historical experience and business model from the III-V compound semiconductor sector. The physical performance expectations for wide-bandgap technologies such as Gallium-Nitride Field-Effect Transistors (GaN FETs) are reviewed. We present some device characteristics. Challenges met in characterising, and prospects for modeling GaN FETs are described. Reliability is identified as the final remaining hurdle facing would-be foundries. Evolutionary and unsurprising applications as well as novel and revolutionary applications are suggested. Novel applications include wholly monolithic switchmode power supplies, simplified tools for ablation and diathermy in tissue, and very wide dynamic range circuits for audio or low phase noise signal generation. We conclude that now is the time to embark on circuit design of MMICs in wide-bandgap technology. The potential for fabless design groups to capitalise upon design IP without strong geopraphic advantage is noted.
机译:宽带隙半导体晶体管技术的发展与其他有源器件技术一起处于历史背景。注意到GaN晶体管的发展相对较快,这归因于照明领域的巨大并行活动以及III-V化合物半导体领域的历史经验和商业模式。对宽带隙技术(如氮化镓场效应晶体管(GaN FET))的物理性能期望进行了评估。我们介绍一些设备特性。描述了在表征方面遇到的挑战,以及对GaN FET建模的前景。可靠性被确定为可能成为铸造厂的最后剩余障碍。提出了进化和毫不奇怪的应用以及新颖和革命性的应用。新颖的应用包括:整体式开关模式电源,用于组织消融和透热的简化工具,以及用于音频或低相位噪声信号生成的超宽动态范围电路。我们得出结论,现在是时候开始在宽带隙技术中进行MMIC的电路设计了。注意到无工厂设计团队利用设计IP而没有强大地理优势的潜力。

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